IEE-LIME-X Series II-SBM and X Series II-MFM Inductively Coupled Plasma - Mass Spectrometry (ICP-MS)

    Equipment/facility: Equipment

    • LocationShow on map

      316 Hosler University Park, PA 16802

      United States

    Equipments Details


    The LIME facility houses two Thermo X-Series II Quadruple ICP-MS equipped with Collision Cell technology and A New Wave UP-213 Laser ablation system for solid sample analysis. Clean lab sample preparation services for dissolution and laser ablation are available. The ICP-MS is used to conduct the following analyses: 1. Trace element analysis in solution - ICP-MS is used to determine low concentrations, ppb and as low as ppt concentrations in solution. At higher concentrations, the ICP-AES is the preferred method of analysis. 2. Trace element composition analysis - ICP-MS is used to determine concentrations of trace element composition in solid samples after digestion. This technique allows for quantification of elements in solid samples at the ppm level. Some of the rare elements can be quantified at high ppb levels. 3. Trace element analysis - ICP-MS/Laser ablation is used to determine concentrations of trace and low weight percent elements in solid samples. This method is often used when acid digestion is difficult and when conducting analysis of heterogeneous samples. The ICP-MS facility also offers method development for interested researchers.


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