MRI-MCL-TEM-FEI Titan3 G2

In a transmission electron microscopy (TEM), a thin electron beam transparent specimen (ideally ≤ 100 nm) is exposed to a high-energy (typically 60 - 300 keV) electron beam. Images generally contain contrast that may be due to differences in crystallinity, atomic mass, or thickness variations within the sample. Crystallographic information can also be obtained from diffraction patterns. We can also collect elemental and chemical state maps via analysis of 1) emitted x-rays (Energy Dispersive Spectroscopy – EDS) or 2) the energy loss of electrons that have gone through the specimen (Electron Energy Loss Spectroscopy – EELS). All of our microscopes at the Materials Characterization Lab can also be operated in STEM mode which may be better in some cases for beam sensitive or low contrast samples.