Keyphrases
Silica
67%
Radiation Effects
42%
Si(111)
38%
Gate Oxide
31%
First-principles Calculations
25%
Band Gap
23%
Atomic Scale
22%
MOSFET
22%
Microscopic Model
21%
Microelectronics
21%
Density Functional Calculations
20%
Performance Reliability
20%
Valence Band Offset
20%
Engineering Level
20%
Defect Generation
18%
Physical Mechanism
17%
Interface Traps
17%
Si-H Bonds
16%
Hydrogenated
16%
Ultrathin
15%
Silicon Carbide
15%
Amorphous Silicon
15%
GaN HEMT
15%
Defect Levels
15%
Hot Electrons
14%
Hydrogen Desorption
12%
Si-SiO2
12%
Oxides
12%
Dangling Bond Defect
12%
Electron Tunneling
11%
Enhanced Low Dose Rate Sensitivity (ELDRS)
11%
Electronic Structure
11%
Ab Initio Study
11%
Dangling Bonds
11%
Hot Electron Stress
11%
Hydrogen Atom
11%
Tunneling
10%
Nanostructures
10%
Silicon Dangling Bond
10%
High-throughput
10%
Molecular Dynamics
10%
Desorption
10%
Defect Interaction
10%
Energy Generation
10%
Annealing
10%
Atomic Displacement
10%
Density Functional Method
9%
Oxygen Vacancy
9%
4H-SiC
9%
Molecular Dynamics Simulation
9%
Material Science
Density
100%
Oxide Compound
93%
Silicon
60%
Electron Mobility
45%
Metal-Oxide-Semiconductor Field-Effect Transistor
41%
Amorphous Silicon
34%
Transistor
32%
Doping (Additives)
28%
Oxidation Reaction
22%
Negative-Bias Temperature Instability
21%
Silicon Dioxide
18%
Hot Electron
17%
Silicon Carbide
17%
Desorption
16%
Hot Electron
16%
Band Offset
15%
Photovoltaics
12%
Metal Oxide
12%
Bulk Silicon
11%
Elastic Moduli
11%
Oxygen Vacancy
10%
Activation Energy
10%
Hot Carrier
10%
Wide Bandgap Semiconductor
10%
Gallium
10%
Bipolar Transistor
10%
Oxide Semiconductor
10%
Sodium
10%
Solar Cell
9%
Electronic Structure
8%
Metastability
7%
Silver
7%
Electronic Structure Calculation
7%
Superlattice
6%
Monolayers
6%
Mechanical Stability
5%
Rubidium
5%
Elasticity
5%
Platinum
5%
Superconducting Material
5%
Aluminum Nitride
5%
Silicon Device
5%
Multilayered Material
5%
Materials Application
5%
Carrier Mobility
5%
Peroxide
5%
Graphene
5%
Permittivity
5%
Engineering
Defects
28%
Engineering
25%
Metal-Oxide-Semiconductor Field-Effect Transistor
25%
Microelectronics
22%
Radiation Effect
20%
Gate Oxide
16%
Valence Band
15%
Band Offset
15%
Dose Rate
14%
Nanomaterial
11%
Dangling Bond
11%
Interface Trap
11%
Activation Energy
11%
Interface Trap
11%
Threshold Energy
11%
Tunnel Construction
11%
Bipolar Transistor
10%
Dopants
10%
Depassivation
9%
Energy Gap
9%
Review Paper
9%
Free Parameter
8%
Structure Calculation
7%
Wide Bandgap Semiconductor
7%
Theoretical Investigation
7%
Energetics
7%
Negative-Bias Temperature Instability
7%
Computer Simulation
6%
Related Defect
6%
Photovoltaics
6%
Energetic Ion
6%
Level Model
6%
Optoelectronics
6%
Oxygen Vacancy
5%
Pn Junction
5%
Frequency Noise
5%
Induced Charge
5%
Maximum Operating Temperature
5%
Binding Calculation
5%
Metal Oxide Semiconductor
5%
Gate Dielectric
5%
Temperature Stress
5%
Diffusion Mechanism
5%
Transients
5%
Electrical Energy
5%