Calculated based on number of publications stored in Pure and citations from Scopus
1993 …2024

Research activity per year

Filter
Conference contribution

Search results

  • 2012

    Sodium, rubidium and cesium in the gate oxides of SiC MOSFETs

    Tuttle, B. R., Dhar, S., Ryu, S. H., Zhu, X., Williams, J. R., Feldman, L. C. & Pantelides, S. T., 2012, Silicon Carbide and Related Materials 2011, ICSCRM 2011. Devaty, R. P., Dudley, M., Chow, T. P. & Neudeck, P. G. (eds.). Trans Tech Publications Ltd, p. 453-456 4 p. (Materials Science Forum; vol. 717-720).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    4 Scopus citations
  • 2011

    Radiation-induced oxide charge in low- and high-H 2 environments

    Rowsey, N. L., Law, M. E., Schrimpf, R. D., Fleetwood, D. M., Tuttle, B. R. & Pantelides, S. T., 2011, RADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings. p. 51-53 3 p. 6131384. (Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Scopus citations
  • 2009

    Performance, reliability, radiation effects, and aging issues in microelectronics - From atomic-scale physics to engineering-level modeling

    Pantelides, S. T., Tsetseris, L., Beck, M. J., Rashkeev, S. N., Hadjisavvas, G., Batyrev, I. G., Tuttle, B. R., Marinopoulos, A. G., Zhou, X. J., Fleetwood, D. M. & Schrimpf, R. D., 2009, ESSCIRC 2009 - Proceedings of the 35th European Solid-State Circuits Conference. p. 76-83 8 p. 5325931. (ESSCIRC 2009 - Proceedings of the 35th European Solid-State Circuits Conference).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • Performance, reliability, radiation effects, and aging issues in microelectronics - From atomic-scale physics to engineering-level modeling

    Pantelides, S. T., Tsetseris, L., Beck, M. J., Rashkeev, S. N., Hadjisawas, G., Batyrev, I., Tuttle, B., Marinopoulos, A. G., Zhou, X. J., Fleetwood, D. M. & Schrimpf, R. D., 2009, Silicon Nitride, Silicon Dioxide, and Emerging Dielectrics 10. 2 ed. Electrochemical Society Inc., p. 319-337 19 p. (ECS Transactions; vol. 19, no. 2).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • Performance, reliability, radiation effects, and aging issues in microelectronics - From atomic-scale physics to engineering-level modeling

    Pantelides, S. T., Tsetseris, L., Beck, M. J., Rashkeev, S. N., Hadjisavvas, G., Batyrev, I. G., Tuttle, B. R., Marinopoulos, A. G., Zhou, X. J., Fleetwood, D. M. & Schrimpf, R. D., 2009, ESSDERC 2009 - Proceedings of the 39th European Solid-State Device Research Conference. p. 48-55 8 p. 5331355. (ESSDERC 2009 - Proceedings of the 39th European Solid-State Device Research Conference).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    3 Scopus citations