Keyphrases
Polaritons
84%
AlGaN-GaN
75%
GaN HEMT
75%
Gamma Irradiation
61%
Si Wafer
44%
Electrical Characteristics
41%
Transistor Structure
40%
Irradiation
39%
Carbon Dots (C-dots)
37%
Enhanced Photodegradation
37%
High Electron Mobility Transistor
35%
Electrically Active Defects
32%
High Dose
29%
Gamma Rays
29%
Active Layer
28%
ZnO Thin Film Transistor
28%
Current-voltage Measurements
28%
Bottom Gate
28%
Non-equilibrium
25%
Bose-Einstein Condensate
25%
X-ray Photoelectron Spectroscopy
25%
TiO2 Photocatalyst
24%
Condensation
23%
Epilayer
23%
Photocurrent
22%
Photoluminescence
20%
Defect Distribution
20%
Spectroscopy Investigation
18%
Teaching Materials
18%
Spectroscopic Diagnostics
18%
Space Application
18%
Molybdenite
18%
MoSe2
18%
Central Region
18%
Exciton-polaritons
18%
Injected Current
18%
Thin-film Transistors
18%
Transverse Electric
18%
Optical Properties
18%
Oxygen Adsorption
18%
Vacuum Condition
18%
Exciton-polariton Condensate
18%
Light Emission
18%
Superlinear
18%
Aid Programmes
18%
Depth-resolved
18%
Optical Characteristics
18%
Sol-gel
18%
Few-layer
18%
Ambient Conditions
18%
Material Science
Transistor
100%
Electron Mobility
75%
ZnO
56%
Thin-Film Transistor
44%
Sol-Gel
42%
Photoluminescence
39%
Carbon Quantum Dot
37%
Titanium Dioxide
37%
Photocatalysts
37%
Electrical Property
32%
X-Ray Photoelectron Spectroscopy
28%
Composite Material
25%
Zinc Oxide
23%
Epilayers
22%
Optical Property
20%
Polystyrene
18%
Nanoparticle
18%
Film
18%
Luminescence
18%
Nitride Compound
18%
Density
18%
Spin Polarization
18%
Chemical Vapor Deposition
18%
Proton Irradiation
18%
Refractive Index
18%
Monolayers
18%
Theoretical Modeling
18%
Semiconductor Laser
18%
Micro-Raman Spectroscopy
15%
Molybdenum
15%
Two-Dimensional Material
15%
Molybdenum Oxide
12%
Defect Density
12%
Point Defect
12%
Atomic Force Microscopy
11%
Titanium Oxide
10%
Heterojunction
10%
Chemical Property
9%
Scanning Electron Microscopy
9%
Structural Property
9%
Capacitance
6%
Spin Coating
6%
Metal-Organic Chemical Vapor Deposition
6%
Grain Boundary
6%
Charge Trapping
6%
Dielectric-Semiconductor Interface
6%
Thin Films
6%