Projects per year
Personal profile
Expertise related to UN Sustainable Development Goals
In 2015, UN member states agreed to 17 global Sustainable Development Goals (SDGs) to end poverty, protect the planet and ensure prosperity for all. This person’s work contributes towards the following SDG(s):
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Collaborations and top research areas from the last five years
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Collaborative Research: Development of a Nanofabrication Lab Manual Featuring a Suite of Low-Cost Experiments to Enable Hands-On Training at Community and Technical Colleges
Ahmed, I. (CoPI), Gray, Z. R. (PI) & Awadelkarim, O. O. (CoPI)
10/1/23 → 9/30/26
Project: Research project
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Microelectronics and Nanomanufacturing Partnership for Veterans
Awadelkarim, O. O. (CoPI), Vaughn, R. (CoPI), Paik, S. J. (CoPI), Awadelkarim, O. O. (PI) & Fontes, A. C. (CoPI)
9/1/22 → 8/31/26
Project: Research project
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Nanotechnology Applications and Career Knowledge Resource Center
Awadelkarim, O. O. (PI), Zentner, L. L. (CoPI), Dalessio, A. A. P. (CoPI), Ehrmann, R. K. (CoPI) & Sanders, W. W. C. (CoPI)
9/1/20 → 8/31/23
Project: Research project
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Collaborative Research: Louis Stokes Regional Center of Excellence: Broadening Participation of Underrepresented Students in STEM Education Using Nanotechnology
Awadelkarim, O. O. (PI) & Ehrmann, R. K. (CoPI)
9/15/18 → 8/31/21
Project: Research project
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Nanotechnology Professional Development Partnership: A Web-Based, Live-Streaming Approach for Optimizing Impact, Effectiveness, and Cost
Awadelkarim, O. O. (PI), Agdasi, S. S. (CoPI), Davis, D. D. M. (CoPI), Dalessio, A. A. P. (CoPI) & Schroeder, K. K. J. (CoPI)
5/15/17 → 10/31/22
Project: Research project
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Comparison of AC and DC BTI in SiC Power MOSFETs
Ghosh, A. K., Awadelkarim, O. O., Hao, J., Suliman, S. & Wang, X., 2022, 2022 IEEE International Reliability Physics Symposium, IRPS 2022 - Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 7A21-7A26 (IEEE International Reliability Physics Symposium Proceedings; vol. 2022-March).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
Open Access10 Scopus citations -
Threshold-voltage bias-instability in SiC MOSFETs: effects of stress temperature and level on oxide charge buildup and recovery
Ghosh, A. K., Hao, J., Cook, M., Suliman, S. A., Wang, X. & Awadelkarim, O. O., Jul 2022, In: Semiconductor Science and Technology. 37, 7, 075015.Research output: Contribution to journal › Article › peer-review
Open Access7 Scopus citations -
An effective lithography training module adapting semianalytical calculation approaches
Cakmak, A. O., Colak, E. & Awadelkarim, O. O., Nov 2021, In: Journal of the Society for Information Display. 29, 11, p. 868-895 28 p.Research output: Contribution to journal › Article › peer-review
Open Access -
Studies of AC BTI Stress in 4H SiC MOSFETs
Ghosh, A. K., Awadelkarim, O. O. & Hao, J., 2021, 2021 IEEE International Integrated Reliability Workshop, IIRW 2021. Institute of Electrical and Electronics Engineers Inc., (IEEE International Integrated Reliability Workshop Final Report; vol. 2021-October).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
8 Scopus citations -
Charge Buildup and Leakage Current in Gold/Parylene-C/ Pentacene Capacitor under Constant-Voltage Stress
Khawaji, I. H., Brigeman, A. N., Awadelkarim, O. O. & Lakhtakia, A., Sep 2020, In: Flexible and Printed Electronics. 5, 3, 035003.Research output: Contribution to journal › Article › peer-review
1 Scopus citations