Projects per year
Personal profile
Expertise related to UN Sustainable Development Goals
In 2015, UN member states agreed to 17 global Sustainable Development Goals (SDGs) to end poverty, protect the planet and ensure prosperity for all. This person’s work contributes towards the following SDG(s):
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Dive into the research topics where Patrick M. Lenahan is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Projects
- 1 Active
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Near Zero Field Magnetoresistance Spectroscopy: A New Tool in Semiconductor Reliability Physics
Lenahan, P. M., Frantz, E. B., King, S. W., Anders, M. A., Moxim, S. J., Ashton, J. P., Myers, K. J., Flatte, M. E. & Harmon, N. J., 2023, 2023 IEEE International Reliability Physics Symposium, IRPS 2023 - Proceedings. Institute of Electrical and Electronics Engineers Inc., (IEEE International Reliability Physics Symposium Proceedings; vol. 2023-March).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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A Comparison of Radiation-Induced and High-Field Electrically Stress-Induced Interface Defects in Si/SiO MOSFETs via Electrically Detected Magnetic Resonance
Sharov, F. V., Moxim, S. J., Haase, G. S., Hughart, D. R. & Lenahan, P. M., Mar 1 2022, In: IEEE Transactions on Nuclear Science. 69, 3, p. 208-215 8 p.Research output: Contribution to journal › Article › peer-review
7 Scopus citations -
A computationally efficient discrete pseudomodulation algorithm for real-time magnetic resonance measurements
Manning, B. R., Sharov, F. V. & Lenahan, P. M., Jan 1 2022, In: Review of Scientific Instruments. 93, 1, 015104.Research output: Contribution to journal › Article › peer-review
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A new approach to electrically detected magnetic resonance: Spin-dependent transient spectroscopy
Myers, K. J., Lenahan, P. M., Ashton, J. P. & Ryan, J. T., Sep 21 2022, In: Journal of Applied Physics. 132, 11, 115301.Research output: Contribution to journal › Article › peer-review
Open Access1 Scopus citations -
Atomic-scale defects generated in the early/intermediate stages of dielectric breakdown in Si/SiO2transistors
Moxim, S. J., Sharov, F. V., Hughart, D. R., Haase, G. S., McKay, C. G. & Lenahan, P. M., Feb 7 2022, In: Applied Physics Letters. 120, 6, 063502.Research output: Contribution to journal › Article › peer-review
5 Scopus citations