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Dive into the research topics where Samia A. Suliman is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Comparison of AC and DC BTI in SiC Power MOSFETs
Ghosh, A. K., Awadelkarim, O. O., Hao, J., Suliman, S. & Wang, X., 2022, 2022 IEEE International Reliability Physics Symposium, IRPS 2022 - Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 7A21-7A26 (IEEE International Reliability Physics Symposium Proceedings; vol. 2022-March).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
26 Link opens in a new tab Scopus citations -
Threshold-voltage bias-instability in SiC MOSFETs: effects of stress temperature and level on oxide charge buildup and recovery
Ghosh, A. K., Hao, J., Cook, M., Suliman, S. A., Wang, X. & Awadelkarim, O. O., Jul 2022, In: Semiconductor Science and Technology. 37, 7, 075015.Research output: Contribution to journal › Article › peer-review
Open Access11 Link opens in a new tab Scopus citations -
Studies of Bias Temperature Instabilities in 4H-SiC DMOSFETs
Ghosh, A., Hao, J., Cook, M., Kendrick, C., Suliman, S. A., Hall, G. D. R., Kopley, T. & Awadelkarim, O. O., Apr 2020, 2020 IEEE International Reliability Physics Symposium, IRPS 2020 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 9128318. (IEEE International Reliability Physics Symposium Proceedings; vol. 2020-April).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
19 Link opens in a new tab Scopus citations -
On the propensity of guiding surface-plasmon-polariton waves by the back-contact of an amorphous silicon p-i-n solar cell
Atalla, M. R. M. & Suliman, S. A., Apr 1 2015, In: Journal of Optics (United Kingdom). 17, 4, 045002.Research output: Contribution to journal › Article › peer-review
2 Link opens in a new tab Scopus citations -
High temperature bias-stress-induced instability in power trench-gated MOSFETs
Hao, J., Rioux, M., Suliman, S. A. & Awadelkarim, O. O., Feb 2014, In: Microelectronics Reliability. 54, 2, p. 374-380 7 p.Research output: Contribution to journal › Article › peer-review
8 Link opens in a new tab Scopus citations