Keyphrases
Low Power
76%
Embedded Nonvolatile Memory (eNVM)
68%
Quantum Computer
66%
Spin-transfer Torque Magnetic RAM (STT-MRAM)
62%
Process Variation
61%
Resistive Random Access Memory (ReRAM)
57%
Quantum Computing
53%
Low Overhead
47%
Domain Wall Memory
45%
Qubit
43%
Adversary
42%
Quantum Circuit
41%
Spin Transfer Torque
38%
Non-volatile Memory
37%
Physically Unclonable Function
37%
Caching
37%
Quantum Approximate Optimization Algorithm
36%
Memory-based
34%
Write Operation
33%
Testing Method
30%
In-memory Computing
28%
In-memory
27%
Energy Efficiency
26%
True Random number Generator
26%
Security Privacy
25%
Quantum Machine Learning
25%
Area Overhead
25%
Hardware Security
24%
Memory Array
24%
Gate Count
24%
Side-channel Attacks
23%
Compiler
22%
EDRAM
22%
Gate Error
22%
Spintronics
22%
Quantum Hardware
22%
Reverse Engineering
21%
Magnetic Tunnel Junction
21%
Sensing Margin
21%
Integrated Circuits
20%
Retention Time
20%
Vulnerability
19%
Quantum Neural Network
19%
CMOS Technology
19%
Bitcell
18%
Clock Stretching
18%
Intellectual Property
18%
Security Issues
18%
Write Latency
18%
Transistor
18%
Computer Science
Non-Volatile Memory
77%
Process Variation
67%
Quantum Computing
49%
Optimization Algorithm
47%
Qubit
45%
Reverse Engineering
45%
Neural Network
42%
Write Operation
41%
Critical Path
40%
Energy Efficiency
39%
Quantum Circuit
37%
Random Access Memory
36%
Quantum Machine Learning
32%
Supply Voltage
30%
Hardware Security
28%
Threshold Voltage
25%
Memory Array
24%
Side Channel Attack
24%
Static Random Access Memory
20%
Obfuscation
19%
Security and Privacy
18%
side-channel
18%
Design Technique
17%
Memory Technology
17%
embedded memory
17%
Attack Model
17%
Cybersecurity
16%
Fault Injection
16%
Wordline
16%
Information Leakage
15%
Hamming Distance
15%
Nonvolatile
14%
Experimental Result
14%
Read Operation
13%
Test Methodology
13%
In-Process
13%
Fault Coverage
12%
And Gate
12%
Cache Memory
12%
Hardware Implementation
12%
Neural Network Architecture
11%
Deep Neural Network
11%
Autonomous System
11%
Clock Period
10%
build-in self-test
10%
Engineering
Reliability Availability and Maintainability (Reliability Engineering)
98%
Qubit
71%
Quantum Circuit
57%
Simulation Result
52%
Resistive
48%
Critical Path
43%
Reverse Engineering
43%
Spin Transfer
36%
Nonvolatile Memory
35%
Retention Time
30%
Process Variation
30%
Area Overhead
29%
Supply Voltage
29%
Magnetic Tunnel Junction
28%
Domain Wall
27%
Fits and Tolerances
22%
Process Variation
21%
Voltage Scaling
20%
Fault Model
20%
Design Technique
20%
Random Access Memory
19%
Circuit Design
19%
Adders
18%
Built-in Self Test
17%
Testing Method
15%
Neural Network Architecture
15%
Optimisation Problem
13%
System-on-Chip
13%
Testability
12%
Experimental Result
12%
Noise Source
11%
Magnetic Field
11%
Side Channel Attack
11%
Test Time
11%
Crosstalk
10%
Level Shifter
10%
Random Number
10%
Power Variation
10%
Interconnects
10%
Dynamic Random Access Memory
10%
Energy Conservation
10%
Logic Gate
10%
Performance Degradation
9%
Transients
9%
Learning Task
9%
