Development of Spectroscopic Ellipsometry as a Non- Destructive Characterization Tool for Ceramic Materials

9308332 Trolier-McKinstry This is a Research Planning Grant (RPG) proposal submitted to the Research Opportunity for Women (ROW) Program. The proposed work uses the spectroscopic ellipsometry (SE) as a nondestructive characterization tool for thin film and graded refractive index transparent materials. The limits of sensitivity of the measuring techniques will be investigated. The absolute accuracy of the measured film refractive index will be calculated as a function of the measured film thickness and the refractive index contrast between the coating and the substrate. Quantitative correlations between film deposition conditions and the film qualities will be made. It can have the effect of facilitating the production of homogeneous and high-quality films. %%% This proposed work uses the spectroscopic ellipsometry (SE) as a nondestructive characterization tool for thin film and graded refractive index transparent materials. It plans to examine the limits of sensitivity of the measurements, and it seeks to separate the effect of microstructural inhomogeneities in the films from the actual optical properties of the material. Transparent films are important in this age of optical communications. This study provides quantitative measures in how to improve the qualities of the films. Its' potentials to improve the optical communication application are very great. ***