Growth and Characterization of New Interlayer Materials for Reproducible High-Tc Josephson Junctions

ECS-9705839 Ying Liu A three year activity is being undertaken during which time, Professors Liu and Schlom will study epitaxial La-doped SrTiO3 and related films deposited on YBCO, with the goal of fabricating reproducible Josephson junction devices using a novel double ramp design. The PIs focus their proposal on growing and characterising the material, and have teamed with a researcher at the Jet Propulsion Laboratory (Kleinsasser) who will provide the device expertise necessary to impact high Tc electronic device applications.