Keyphrases
X-ray Spectroscopy
100%
Lithographic Technique
100%
Grating
100%
Reflection Grating
100%
Remote Sensing Instrument
50%
Grayscale E-beam Lithography
50%
Full Potential
50%
Fabrication Methods
50%
Three-dimensional (3D)
50%
Sensor Technology
50%
Anisotropic Etching
50%
Electron Beam Lithography
50%
Nanoimprint Lithography
50%
Scherrer
50%
Chandra X-ray Observatory
50%
Groove Profile
50%
Generation X
50%
Off-plane Gratings
50%
University of Iowa
50%
Photoresist
50%
Spectrometer
50%
Crystalline Silicon
50%
Technology Roadmap
50%
Space Technology
50%
Engineering
Electron Optical Lithography
100%
Research Group
100%
Crystalline Silicon
50%
Nanoimprint Lithography
50%
Sensing Instrument
50%
Anisotropic
50%
Grayscale
50%
Photoresist
50%
NASA
50%
Material Science
X-Ray Spectroscopy
100%
Lithography
100%
Silicon
33%
Anisotropic Etching
33%