TY - JOUR
T1 - 130 mA mm-1β-Ga2O3metal semiconductor field effect transistor with low-temperature metalorganic vapor phase epitaxy-regrown ohmic contacts
AU - Bhattacharyya, Arkka
AU - Roy, Saurav
AU - Ranga, Praneeth
AU - Shoemaker, Daniel
AU - Song, Yiwen
AU - Lundh, James Spencer
AU - Choi, Sukwon
AU - Krishnamoorthy, Sriram
N1 - Publisher Copyright:
© 2021 The Japan Society of Applied Physics.
PY - 2021/7
Y1 - 2021/7
N2 - We report on the first demonstration of metalorganic vapor phase epitaxy-regrown (MOVPE) ohmic contacts in an all MOVPE-grown β-Ga2O3 metal semiconductor field effect transistor (MESFET). The low-temperature (600 °C) heavy (n+) Si-doped regrown layers exhibit extremely high conductivity with a sheet resistance of 73 Ω/□ and a record low metal/n+-Ga2O3 contact resistance of 80 mΩ•mm and specific contact resistivity of 8.3 × 10-7 Ω•cm2 were achieved. The fabricated MESFETs exhibit a maximum ON current of 130 mA mm-1 and a high I ON/I OFF ratio of >1010. Thermal characterization was also performed to assess the device self-heating under the high current and power conditions.
AB - We report on the first demonstration of metalorganic vapor phase epitaxy-regrown (MOVPE) ohmic contacts in an all MOVPE-grown β-Ga2O3 metal semiconductor field effect transistor (MESFET). The low-temperature (600 °C) heavy (n+) Si-doped regrown layers exhibit extremely high conductivity with a sheet resistance of 73 Ω/□ and a record low metal/n+-Ga2O3 contact resistance of 80 mΩ•mm and specific contact resistivity of 8.3 × 10-7 Ω•cm2 were achieved. The fabricated MESFETs exhibit a maximum ON current of 130 mA mm-1 and a high I ON/I OFF ratio of >1010. Thermal characterization was also performed to assess the device self-heating under the high current and power conditions.
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U2 - 10.35848/1882-0786/ac07ef
DO - 10.35848/1882-0786/ac07ef
M3 - Article
AN - SCOPUS:85108799391
SN - 1882-0778
VL - 14
JO - Applied Physics Express
JF - Applied Physics Express
IS - 7
M1 - 076502
ER -