TY - GEN
T1 - 2.3 kV GaN Super-Heterojunction FET for Cryogenic Power Switching
AU - Sadek, Mansura
AU - Kemmerling, Jesse T.
AU - Visvkarma, Ajay Kumar
AU - Guan, Rian
AU - Xiong, Yixin
AU - Song, Jianan
AU - Lundh, James Spencer
AU - Hobart, Karl
AU - Anderson, Travis
AU - Chu, Rongming
N1 - Publisher Copyright:
© 2024 IEEE.
PY - 2024
Y1 - 2024
N2 - Power switches capable of cryogenic temperature operation are desired for cryogenic systems, such as rocket propulsion systems and superconducting machines. Si and SiC MOSFETs are potential candidates for cryogenic power switching. They are vertical devices with a doped drift region. While the carrier mobility may increase with decreasing temperature, carrier freezeout at low temperature causes degradation of on-resistance (RON). GaN lateral HEMT, where 2DEG is free from carrier freezeout, is another strong candidate for cryogenic power switching. GaN HEMTs show 5X reduction in RON at cryogenic temperature, due to increase in mobility resulting from reduced electron-phonon scattering. However, the maximum operating voltage of GaN HEMT at cryogenic temperature is limited to 650 V [1] , insufficient for high power systems. GaN super-heterojunction (SHJ) FET offers a path to scale the operating voltage to over 10 kV [2] , by leveraging charge-balance in the SHJ structure. This paper provides the 1 st report of characteristics of GaN SHJ FET at cryogenic temperature.
AB - Power switches capable of cryogenic temperature operation are desired for cryogenic systems, such as rocket propulsion systems and superconducting machines. Si and SiC MOSFETs are potential candidates for cryogenic power switching. They are vertical devices with a doped drift region. While the carrier mobility may increase with decreasing temperature, carrier freezeout at low temperature causes degradation of on-resistance (RON). GaN lateral HEMT, where 2DEG is free from carrier freezeout, is another strong candidate for cryogenic power switching. GaN HEMTs show 5X reduction in RON at cryogenic temperature, due to increase in mobility resulting from reduced electron-phonon scattering. However, the maximum operating voltage of GaN HEMT at cryogenic temperature is limited to 650 V [1] , insufficient for high power systems. GaN super-heterojunction (SHJ) FET offers a path to scale the operating voltage to over 10 kV [2] , by leveraging charge-balance in the SHJ structure. This paper provides the 1 st report of characteristics of GaN SHJ FET at cryogenic temperature.
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U2 - 10.1109/DRC61706.2024.10605293
DO - 10.1109/DRC61706.2024.10605293
M3 - Conference contribution
AN - SCOPUS:85201060744
T3 - Device Research Conference - Conference Digest, DRC
BT - DRC 2024 - 82nd Device Research Conference
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 82nd Device Research Conference, DRC 2024
Y2 - 24 June 2024 through 26 June 2024
ER -