2D bismuth telluride analyzed by XPS

Jeffrey R. Shallenberger, Christopher M. Smyth, Rafik Addou, Robert M. Wallace

Research output: Contribution to journalArticlepeer-review

6 Scopus citations


Bismuth telluride (Bi2Te3) was analyzed using x-ray photoelectron spectroscopy. A freshly exfoliated, oxygen-free flake was analyzed. Spectral regions for O 1s, Te 3d, C 1s, Bi 4f, Bi 5d, and Te 4d were acquired. Bulk quantitative analyses by x-ray fluorescence, inductively coupled plasma-mass spectrometry, and x-ray diffraction indicated that the material was stoichiometric, contained low concentrations of impurities, and was phase pure, respectively.

Original languageEnglish (US)
Article number024011
JournalSurface Science Spectra
Issue number2
StatePublished - Dec 1 2019

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films


Dive into the research topics of '2D bismuth telluride analyzed by XPS'. Together they form a unique fingerprint.

Cite this