TY - JOUR
T1 - 2D bismuth telluride analyzed by XPS
AU - Shallenberger, Jeffrey R.
AU - Smyth, Christopher M.
AU - Addou, Rafik
AU - Wallace, Robert M.
N1 - Funding Information:
This study is based upon research conducted at The Pennsylvania State University Two-Dimensional Crystal Consortium— Materials Innovation Platform (2DCC-MIP) which is supported by NSF cooperative agreement No. DMR-1539916.
Publisher Copyright:
© 2019 Author(s).
PY - 2019/12/1
Y1 - 2019/12/1
N2 - Bismuth telluride (Bi2Te3) was analyzed using x-ray photoelectron spectroscopy. A freshly exfoliated, oxygen-free flake was analyzed. Spectral regions for O 1s, Te 3d, C 1s, Bi 4f, Bi 5d, and Te 4d were acquired. Bulk quantitative analyses by x-ray fluorescence, inductively coupled plasma-mass spectrometry, and x-ray diffraction indicated that the material was stoichiometric, contained low concentrations of impurities, and was phase pure, respectively.
AB - Bismuth telluride (Bi2Te3) was analyzed using x-ray photoelectron spectroscopy. A freshly exfoliated, oxygen-free flake was analyzed. Spectral regions for O 1s, Te 3d, C 1s, Bi 4f, Bi 5d, and Te 4d were acquired. Bulk quantitative analyses by x-ray fluorescence, inductively coupled plasma-mass spectrometry, and x-ray diffraction indicated that the material was stoichiometric, contained low concentrations of impurities, and was phase pure, respectively.
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U2 - 10.1116/1.5120015
DO - 10.1116/1.5120015
M3 - Article
AN - SCOPUS:85075104360
SN - 1055-5269
VL - 26
JO - Surface Science Spectra
JF - Surface Science Spectra
IS - 2
M1 - 024011
ER -