2D bismuth telluride analyzed by XPS

Jeffrey R. Shallenberger; Christopher M. Smyth; Rafik Addou; Robert M. Wallace

doi:10.1116/1.5120015

2D bismuth telluride analyzed by XPS

Jeffrey R. Shallenberger
, Christopher M. Smyth
, Rafik Addou
, Robert M. Wallace

Materials Characterization Lab

Research output: Contribution to journal › Article › peer-review

12 Scopus citations

Abstract

Bismuth telluride (Bi₂Te₃) was analyzed using x-ray photoelectron spectroscopy. A freshly exfoliated, oxygen-free flake was analyzed. Spectral regions for O 1s, Te 3d, C 1s, Bi 4f, Bi 5d, and Te 4d were acquired. Bulk quantitative analyses by x-ray fluorescence, inductively coupled plasma-mass spectrometry, and x-ray diffraction indicated that the material was stoichiometric, contained low concentrations of impurities, and was phase pure, respectively.

Original language	English (US)
Article number	024011
Journal	Surface Science Spectra
Volume	26
Issue number	2
DOIs	https://doi.org/10.1116/1.5120015
State	Published - Dec 1 2019

All Science Journal Classification (ASJC) codes

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films

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10.1116/1.5120015

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title = "2D bismuth telluride analyzed by XPS",

abstract = "Bismuth telluride (Bi2Te3) was analyzed using x-ray photoelectron spectroscopy. A freshly exfoliated, oxygen-free flake was analyzed. Spectral regions for O 1s, Te 3d, C 1s, Bi 4f, Bi 5d, and Te 4d were acquired. Bulk quantitative analyses by x-ray fluorescence, inductively coupled plasma-mass spectrometry, and x-ray diffraction indicated that the material was stoichiometric, contained low concentrations of impurities, and was phase pure, respectively.",

author = "Shallenberger, \{Jeffrey R.\} and Smyth, \{Christopher M.\} and Rafik Addou and Wallace, \{Robert M.\}",

note = "Publisher Copyright: {\textcopyright} 2019 Author(s).",

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doi = "10.1116/1.5120015",

language = "English (US)",

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T1 - 2D bismuth telluride analyzed by XPS

AU - Shallenberger, Jeffrey R.

AU - Smyth, Christopher M.

AU - Addou, Rafik

AU - Wallace, Robert M.

PY - 2019/12/1

Y1 - 2019/12/1

N2 - Bismuth telluride (Bi2Te3) was analyzed using x-ray photoelectron spectroscopy. A freshly exfoliated, oxygen-free flake was analyzed. Spectral regions for O 1s, Te 3d, C 1s, Bi 4f, Bi 5d, and Te 4d were acquired. Bulk quantitative analyses by x-ray fluorescence, inductively coupled plasma-mass spectrometry, and x-ray diffraction indicated that the material was stoichiometric, contained low concentrations of impurities, and was phase pure, respectively.

AB - Bismuth telluride (Bi2Te3) was analyzed using x-ray photoelectron spectroscopy. A freshly exfoliated, oxygen-free flake was analyzed. Spectral regions for O 1s, Te 3d, C 1s, Bi 4f, Bi 5d, and Te 4d were acquired. Bulk quantitative analyses by x-ray fluorescence, inductively coupled plasma-mass spectrometry, and x-ray diffraction indicated that the material was stoichiometric, contained low concentrations of impurities, and was phase pure, respectively.

UR - https://www.scopus.com/pages/publications/85075104360

UR - https://www.scopus.com/pages/publications/85075104360#tab=citedBy

U2 - 10.1116/1.5120015

DO - 10.1116/1.5120015

M3 - Article

AN - SCOPUS:85075104360

SN - 1055-5269

VL - 26

JO - Surface Science Spectra

JF - Surface Science Spectra

IS - 2

M1 - 024011

ER -

2D bismuth telluride analyzed by XPS

Abstract

All Science Journal Classification (ASJC) codes

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