TY - JOUR
T1 - 2D topological insulator bismuth selenide analyzed by in situ XPS
AU - Wang, Xinglu
AU - Smyth, Christopher M.
AU - Khosravi, Ava
AU - Cormier, Christopher R.
AU - Shallenberger, Jeffrey R.
AU - Addou, Rafik
AU - Wallace, Robert M.
N1 - Funding Information:
This work was supported in part by NEWLIMITS, a center in nCORE, a Semiconductor Research Corporation (SRC) program sponsored by the National Institute of Standards and Technology (NIST) through Award Number 70NANB17H041. This work was also supported by PSU Two-Dimensional Crystal Consortium for the materials under National Science Foundation (NSF) Cooperative Agreement No. DMR-1539916.
Publisher Copyright:
© 2020 Author(s).
PY - 2019/12/1
Y1 - 2019/12/1
N2 - Bismuth selenide (Bi2Se3), a two-dimensional topological insulator material purchased from Alfa Aesar, was analyzed using in situ x-ray photoelectron spectroscopy (XPS). The XPS spectra obtained from a fresh surface exfoliated in ultrahigh vacuum include a survey scan, high resolution spectra of O 1s, Bi 5d, Se 3d, Bi 4f, Se 3p, Se LMM, C 1s, and the valence band. Quantitative analysis indicates a Se deficient surface composition of Bi2Se2.8, which is consistent with the Fermi level position in the conduction band detected in this work.
AB - Bismuth selenide (Bi2Se3), a two-dimensional topological insulator material purchased from Alfa Aesar, was analyzed using in situ x-ray photoelectron spectroscopy (XPS). The XPS spectra obtained from a fresh surface exfoliated in ultrahigh vacuum include a survey scan, high resolution spectra of O 1s, Bi 5d, Se 3d, Bi 4f, Se 3p, Se LMM, C 1s, and the valence band. Quantitative analysis indicates a Se deficient surface composition of Bi2Se2.8, which is consistent with the Fermi level position in the conduction band detected in this work.
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U2 - 10.1116/1.5130891
DO - 10.1116/1.5130891
M3 - Article
AN - SCOPUS:85077966166
SN - 1055-5269
VL - 26
JO - Surface Science Spectra
JF - Surface Science Spectra
IS - 2
M1 - 024014
ER -