2D topological insulator bismuth selenide analyzed by in situ XPS

Xinglu Wang; Christopher M. Smyth; Ava Khosravi; Christopher R. Cormier; Jeffrey R. Shallenberger; Rafik Addou; Robert M. Wallace

doi:10.1116/1.5130891

2D topological insulator bismuth selenide analyzed by in situ XPS

Xinglu Wang
, Christopher M. Smyth
, Ava Khosravi
, Christopher R. Cormier
, Jeffrey R. Shallenberger
, Rafik Addou
, Robert M. Wallace

Materials Characterization Lab

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

Bismuth selenide (Bi₂Se₃), a two-dimensional topological insulator material purchased from Alfa Aesar, was analyzed using in situ x-ray photoelectron spectroscopy (XPS). The XPS spectra obtained from a fresh surface exfoliated in ultrahigh vacuum include a survey scan, high resolution spectra of O 1s, Bi 5d, Se 3d, Bi 4f, Se 3p, Se LMM, C 1s, and the valence band. Quantitative analysis indicates a Se deficient surface composition of Bi₂Se_2.8, which is consistent with the Fermi level position in the conduction band detected in this work.

Original language	English (US)
Article number	024014
Journal	Surface Science Spectra
Volume	26
Issue number	2
DOIs	https://doi.org/10.1116/1.5130891
State	Published - Dec 1 2019

All Science Journal Classification (ASJC) codes

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films

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10.1116/1.5130891

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@article{1fbc61330ca9499db6dc725070550ac6,

title = "2D topological insulator bismuth selenide analyzed by in situ XPS",

abstract = "Bismuth selenide (Bi2Se3), a two-dimensional topological insulator material purchased from Alfa Aesar, was analyzed using in situ x-ray photoelectron spectroscopy (XPS). The XPS spectra obtained from a fresh surface exfoliated in ultrahigh vacuum include a survey scan, high resolution spectra of O 1s, Bi 5d, Se 3d, Bi 4f, Se 3p, Se LMM, C 1s, and the valence band. Quantitative analysis indicates a Se deficient surface composition of Bi2Se2.8, which is consistent with the Fermi level position in the conduction band detected in this work.",

author = "Xinglu Wang and Smyth, \{Christopher M.\} and Ava Khosravi and Cormier, \{Christopher R.\} and Shallenberger, \{Jeffrey R.\} and Rafik Addou and Wallace, \{Robert M.\}",

note = "Publisher Copyright: {\textcopyright} 2020 Author(s).",

year = "2019",

month = dec,

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doi = "10.1116/1.5130891",

language = "English (US)",

volume = "26",

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T1 - 2D topological insulator bismuth selenide analyzed by in situ XPS

AU - Wang, Xinglu

AU - Smyth, Christopher M.

AU - Khosravi, Ava

AU - Cormier, Christopher R.

AU - Shallenberger, Jeffrey R.

AU - Addou, Rafik

AU - Wallace, Robert M.

PY - 2019/12/1

Y1 - 2019/12/1

N2 - Bismuth selenide (Bi2Se3), a two-dimensional topological insulator material purchased from Alfa Aesar, was analyzed using in situ x-ray photoelectron spectroscopy (XPS). The XPS spectra obtained from a fresh surface exfoliated in ultrahigh vacuum include a survey scan, high resolution spectra of O 1s, Bi 5d, Se 3d, Bi 4f, Se 3p, Se LMM, C 1s, and the valence band. Quantitative analysis indicates a Se deficient surface composition of Bi2Se2.8, which is consistent with the Fermi level position in the conduction band detected in this work.

AB - Bismuth selenide (Bi2Se3), a two-dimensional topological insulator material purchased from Alfa Aesar, was analyzed using in situ x-ray photoelectron spectroscopy (XPS). The XPS spectra obtained from a fresh surface exfoliated in ultrahigh vacuum include a survey scan, high resolution spectra of O 1s, Bi 5d, Se 3d, Bi 4f, Se 3p, Se LMM, C 1s, and the valence band. Quantitative analysis indicates a Se deficient surface composition of Bi2Se2.8, which is consistent with the Fermi level position in the conduction band detected in this work.

UR - https://www.scopus.com/pages/publications/85077966166

UR - https://www.scopus.com/pages/publications/85077966166#tab=citedBy

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M3 - Article

AN - SCOPUS:85077966166

SN - 1055-5269

VL - 26

JO - Surface Science Spectra

JF - Surface Science Spectra

IS - 2

M1 - 024014

ER -

2D topological insulator bismuth selenide analyzed by in situ XPS

Abstract

All Science Journal Classification (ASJC) codes

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