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2D tungsten diselenide analyzed by XPS
Jeffrey R. Shallenberger
Materials Characterization Lab
Research output
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Contribution to journal
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Article
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peer-review
18
Scopus citations
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Dive into the research topics of '2D tungsten diselenide analyzed by XPS'. Together they form a unique fingerprint.
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Physics & Astronomy
x ray fluorescence
100%
flakes
83%
x ray spectroscopy
74%
x ray diffraction
63%
tungsten
62%
photoelectron spectroscopy
60%
valence
53%
oxygen
44%
Chemical Compounds
Diselenide
89%
Valence Band
80%
Flake Like Crystal
77%
Photoelectron Spectroscopy
72%
Tungsten
67%
Fluorescence
42%
Purity
37%
Engineering & Materials Science
X ray photoelectron spectroscopy
89%
Tungsten
79%
X rays
66%
Valence bands
43%
Photoelectron spectroscopy
41%
Fluorescence
28%
Diffraction
26%
Oxygen
19%