A comparison of three-dimensional simulations of traveling-wave tube cold-test characteristics using CST microwave studio and Mafia

C. T. Chevalier; K. A. Herrmann; C. L. Kory; J. D. Wilson; A. W. Cross

doi:10.1109/IVELEC.2002.999236

A comparison of three-dimensional simulations of traveling-wave tube cold-test characteristics using CST microwave studio and Mafia

C. T. Chevalier, K. A. Herrmann, C. L. Kory, J. D. Wilson, A. W. Cross

Penn State Mont Alto

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

7 Scopus citations

Original language	English (US)
Title of host publication	3rd IEEE International Vacuum Electronics Conference, IVEC 2002
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	15-16
Number of pages	2
ISBN (Electronic)	0780372565, 9780780372566
DOIs	https://doi.org/10.1109/IVELEC.2002.999236
State	Published - 2002
Event	3rd IEEE International Vacuum Electronics Conference, IVEC 2002 - Monterey, United States Duration: Apr 23 2002 → Apr 25 2002

Publication series

Name	3rd IEEE International Vacuum Electronics Conference, IVEC 2002

Other

Other	3rd IEEE International Vacuum Electronics Conference, IVEC 2002
Country/Territory	United States
City	Monterey
Period	4/23/02 → 4/25/02

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering

Access to Document

10.1109/IVELEC.2002.999236

Cite this

Chevalier, C. T., Herrmann, K. A., Kory, C. L., Wilson, J. D., & Cross, A. W. (2002). A comparison of three-dimensional simulations of traveling-wave tube cold-test characteristics using CST microwave studio and Mafia. In 3rd IEEE International Vacuum Electronics Conference, IVEC 2002 (pp. 15-16). Article 999236 (3rd IEEE International Vacuum Electronics Conference, IVEC 2002). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IVELEC.2002.999236

Chevalier, C. T. ; Herrmann, K. A. ; Kory, C. L. et al. / A comparison of three-dimensional simulations of traveling-wave tube cold-test characteristics using CST microwave studio and Mafia. 3rd IEEE International Vacuum Electronics Conference, IVEC 2002. Institute of Electrical and Electronics Engineers Inc., 2002. pp. 15-16 (3rd IEEE International Vacuum Electronics Conference, IVEC 2002).

@inproceedings{e098522a7e97403aa94d6d137d0e813e,

title = "A comparison of three-dimensional simulations of traveling-wave tube cold-test characteristics using CST microwave studio and Mafia",

author = "Chevalier, {C. T.} and Herrmann, {K. A.} and Kory, {C. L.} and Wilson, {J. D.} and Cross, {A. W.}",

year = "2002",

doi = "10.1109/IVELEC.2002.999236",

language = "English (US)",

series = "3rd IEEE International Vacuum Electronics Conference, IVEC 2002",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "15--16",

booktitle = "3rd IEEE International Vacuum Electronics Conference, IVEC 2002",

address = "United States",

note = "3rd IEEE International Vacuum Electronics Conference, IVEC 2002 ; Conference date: 23-04-2002 Through 25-04-2002",

}

Chevalier, CT, Herrmann, KA, Kory, CL, Wilson, JD & Cross, AW 2002, A comparison of three-dimensional simulations of traveling-wave tube cold-test characteristics using CST microwave studio and Mafia. in 3rd IEEE International Vacuum Electronics Conference, IVEC 2002., 999236, 3rd IEEE International Vacuum Electronics Conference, IVEC 2002, Institute of Electrical and Electronics Engineers Inc., pp. 15-16, 3rd IEEE International Vacuum Electronics Conference, IVEC 2002, Monterey, United States, 4/23/02. https://doi.org/10.1109/IVELEC.2002.999236

A comparison of three-dimensional simulations of traveling-wave tube cold-test characteristics using CST microwave studio and Mafia. / Chevalier, C. T.; Herrmann, K. A.; Kory, C. L. et al.
3rd IEEE International Vacuum Electronics Conference, IVEC 2002. Institute of Electrical and Electronics Engineers Inc., 2002. p. 15-16 999236 (3rd IEEE International Vacuum Electronics Conference, IVEC 2002).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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AU - Wilson, J. D.

AU - Cross, A. W.

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M3 - Conference contribution

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T3 - 3rd IEEE International Vacuum Electronics Conference, IVEC 2002

SP - 15

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BT - 3rd IEEE International Vacuum Electronics Conference, IVEC 2002

PB - Institute of Electrical and Electronics Engineers Inc.

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Chevalier CT, Herrmann KA, Kory CL, Wilson JD, Cross AW. A comparison of three-dimensional simulations of traveling-wave tube cold-test characteristics using CST microwave studio and Mafia. In 3rd IEEE International Vacuum Electronics Conference, IVEC 2002. Institute of Electrical and Electronics Engineers Inc. 2002. p. 15-16. 999236. (3rd IEEE International Vacuum Electronics Conference, IVEC 2002). doi: 10.1109/IVELEC.2002.999236

A comparison of three-dimensional simulations of traveling-wave tube cold-test characteristics using CST microwave studio and Mafia

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Other

All Science Journal Classification (ASJC) codes

Access to Document

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Cite this