A generic and reconfigurable test paradigm using low-cost integrated poly-Si TFTs

Keyphrases

• Reconfigurable 100%
• Low Power 33%
• Test Design 33%
• Polymer Glasses 33%
• 3D Technology 33%
• Silicon Area 33%
• Test Cost 33%
• Power Processes 33%
• Test Unit 33%
• Verifiability 33%
• LTPS TFT 33%
• VLSI Systems 33%
• Test Circuit 33%
• Diagnosability 33%

Engineering

• Test Structure 100%
• Polysilicon 100%
• Low-Temperature 50%
• Thin-Film Transistor 50%
• Redesign 50%
• Test Circuit 50%
• Built-in Self Test 50%
• Test Unit 50%