A low cost platform for linking transport properties to the structure of nanomaterials

S. Y. Xu; J. Xu; M. L. Tian

doi:10.1088/0957-4484/17/5/051

A low cost platform for linking transport properties to the structure of nanomaterials

S. Y. Xu, J. Xu, M. L. Tian

Research output: Contribution to journal › Article › peer-review

14 Scopus citations

Abstract

A low cost platform made of a silicon nitride window with pre-patterned metallic leads has been fabricated. The platform is compatible for both transmission electron microscopy (TEM) studies and electrical transport measurements. We demonstrated that TEM analyses, in situ local structure modification with a high intensity electron beam and ex situ transport measurements can be performed for the same individual nanowire assembled on this platform. The platform can therefore be used to directly link the transport properties of a testing nanomaterial or a nanodevice to its morphological, structural and chemical properties.

Original language	English (US)
Pages (from-to)	1470-1475
Number of pages	6
Journal	Nanotechnology
Volume	17
Issue number	5
DOIs	https://doi.org/10.1088/0957-4484/17/5/051
State	Published - Mar 14 2006

All Science Journal Classification (ASJC) codes

Bioengineering
General Chemistry
General Materials Science
Mechanics of Materials
Mechanical Engineering
Electrical and Electronic Engineering

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10.1088/0957-4484/17/5/051

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abstract = "A low cost platform made of a silicon nitride window with pre-patterned metallic leads has been fabricated. The platform is compatible for both transmission electron microscopy (TEM) studies and electrical transport measurements. We demonstrated that TEM analyses, in situ local structure modification with a high intensity electron beam and ex situ transport measurements can be performed for the same individual nanowire assembled on this platform. The platform can therefore be used to directly link the transport properties of a testing nanomaterial or a nanodevice to its morphological, structural and chemical properties.",

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AU - Tian, M. L.

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N2 - A low cost platform made of a silicon nitride window with pre-patterned metallic leads has been fabricated. The platform is compatible for both transmission electron microscopy (TEM) studies and electrical transport measurements. We demonstrated that TEM analyses, in situ local structure modification with a high intensity electron beam and ex situ transport measurements can be performed for the same individual nanowire assembled on this platform. The platform can therefore be used to directly link the transport properties of a testing nanomaterial or a nanodevice to its morphological, structural and chemical properties.

AB - A low cost platform made of a silicon nitride window with pre-patterned metallic leads has been fabricated. The platform is compatible for both transmission electron microscopy (TEM) studies and electrical transport measurements. We demonstrated that TEM analyses, in situ local structure modification with a high intensity electron beam and ex situ transport measurements can be performed for the same individual nanowire assembled on this platform. The platform can therefore be used to directly link the transport properties of a testing nanomaterial or a nanodevice to its morphological, structural and chemical properties.

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A low cost platform for linking transport properties to the structure of nanomaterials

Abstract

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