A microwave dielectric measurement technique for high permitivity materials

M. T. Lanagan; J. H. Kim; D. C. Dube; S. J. Jang; R. E. Newnham

doi:10.1080/00150198808201341

A microwave dielectric measurement technique for high permitivity materials

M. T. Lanagan, J. H. Kim, D. C. Dube, S. J. Jang, R. E. Newnham

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	91-97
Number of pages	7
Journal	Ferroelectrics
Volume	82
Issue number	1
DOIs	https://doi.org/10.1080/00150198808201341
State	Published - Jun 1988

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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10.1080/00150198808201341

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@article{6ee9b5c02ca04a6f9cdbe2c5f47c1c3b,

title = "A microwave dielectric measurement technique for high permitivity materials",

author = "Lanagan, {M. T.} and Kim, {J. H.} and Dube, {D. C.} and Jang, {S. J.} and Newnham, {R. E.}",

year = "1988",

month = jun,

doi = "10.1080/00150198808201341",

language = "English (US)",

volume = "82",

pages = "91--97",

journal = "Ferroelectrics",

issn = "0015-0193",

publisher = "Taylor and Francis Ltd.",

number = "1",

}

TY - JOUR

T1 - A microwave dielectric measurement technique for high permitivity materials

AU - Lanagan, M. T.

AU - Kim, J. H.

AU - Dube, D. C.

AU - Jang, S. J.

AU - Newnham, R. E.

PY - 1988/6

Y1 - 1988/6

UR - http://www.scopus.com/inward/record.url?scp=84948867906&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84948867906&partnerID=8YFLogxK

U2 - 10.1080/00150198808201341

DO - 10.1080/00150198808201341

M3 - Article

AN - SCOPUS:84948867906

SN - 0015-0193

VL - 82

SP - 91

EP - 97

JO - Ferroelectrics

JF - Ferroelectrics

IS - 1

ER -

A microwave dielectric measurement technique for high permitivity materials

All Science Journal Classification (ASJC) codes

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