A microwave dielectric measurement technique for high permitivity materials

M. T. Lanagan; J. H. Kim; D. C. Dube; S. J. Jang; R. E. Newnham

doi:10.1080/00150198808201341

A microwave dielectric measurement technique for high permitivity materials

M. T. Lanagan
, J. H. Kim
, D. C. Dube
, S. J. Jang
, R. E. Newnham

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	91-97
Number of pages	7
Journal	Ferroelectrics
Volume	82
Issue number	1
DOIs	https://doi.org/10.1080/00150198808201341
State	Published - Jun 1988

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

Access to Document

10.1080/00150198808201341

Cite this

@article{6ee9b5c02ca04a6f9cdbe2c5f47c1c3b,

title = "A microwave dielectric measurement technique for high permitivity materials",

author = "Lanagan, \{M. T.\} and Kim, \{J. H.\} and Dube, \{D. C.\} and Jang, \{S. J.\} and Newnham, \{R. E.\}",

year = "1988",

month = jun,

doi = "10.1080/00150198808201341",

language = "English (US)",

volume = "82",

pages = "91--97",

journal = "Ferroelectrics",

issn = "0015-0193",

publisher = "Taylor and Francis Ltd.",

number = "1",

}

TY - JOUR

T1 - A microwave dielectric measurement technique for high permitivity materials

AU - Lanagan, M. T.

AU - Kim, J. H.

AU - Dube, D. C.

AU - Jang, S. J.

AU - Newnham, R. E.

PY - 1988/6

Y1 - 1988/6

UR - https://www.scopus.com/pages/publications/84948867906

UR - https://www.scopus.com/pages/publications/84948867906#tab=citedBy

U2 - 10.1080/00150198808201341

DO - 10.1080/00150198808201341

M3 - Article

AN - SCOPUS:84948867906

SN - 0015-0193

VL - 82

SP - 91

EP - 97

JO - Ferroelectrics

JF - Ferroelectrics

IS - 1

ER -

A microwave dielectric measurement technique for high permitivity materials

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Cite this