Keyphrases
MOSFET
100%
Negative Bias Temperature Instability
100%
Nitrided Oxide
100%
PMOSFET
42%
Silicon Dioxide
28%
Simplifying Assumption
28%
Defect Distribution
28%
Reaction-diffusion Model
28%
Electron Paramagnetic Resonance
14%
Metal Oxide
14%
Transistor Technology
14%
Field-effect Transistors
14%
Bond Breaking
14%
Reliability Issues
14%
Recovery Rate
14%
Interface Traps
14%
Defect Centers
14%
Rapid Rate
14%
First-order Approximation
14%
Defect Chemistry
14%
Time Response
14%
Pure Silicon
14%
Hydrogen Trap
14%
Rebonding
14%
Power-law Response
14%
Hydrogenic
14%
Material Science
Oxide Compound
100%
Metal-Oxide-Semiconductor Field-Effect Transistor
100%
Negative-Bias Temperature Instability
100%
Silicon
42%
Silicon Dioxide
28%
Field Effect Transistor
14%
Metal Oxide
14%
Engineering
Interface Trap
14%
Approximation Order
14%