A model for power-supply noise injection in long interconnects

Martin Saint-Laurent, Madhavan Swaminathan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

For long interconnects, the power-supply noise injected through the repeaters can be more critical than crosstalk simply because there is no easy way to get rid of it. This paper rigorously analyzes the injection mechanism using a novel device model. A closed-form expression quantifying the interconnect delay variations caused by the noise is derived. For typical 130-nm interconnects, the model is shown to be very accurate.

Original languageEnglish (US)
Title of host publicationProceedings of the IEEE 2004 International Interconnect Technology Conference
Pages113-115
Number of pages3
StatePublished - 2004
EventProceedings of the IEEE 2004 International Interconnect Technology Conference - Burlingame, CA, United States
Duration: Jun 7 2004Jun 9 2004

Publication series

NameProceedings of the IEEE 2004 International Interconnect Technology Conference

Conference

ConferenceProceedings of the IEEE 2004 International Interconnect Technology Conference
Country/TerritoryUnited States
CityBurlingame, CA
Period6/7/046/9/04

All Science Journal Classification (ASJC) codes

  • General Engineering

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