TY - GEN
T1 - A model for power-supply noise injection in long interconnects
AU - Saint-Laurent, Martin
AU - Swaminathan, Madhavan
PY - 2004
Y1 - 2004
N2 - For long interconnects, the power-supply noise injected through the repeaters can be more critical than crosstalk simply because there is no easy way to get rid of it. This paper rigorously analyzes the injection mechanism using a novel device model. A closed-form expression quantifying the interconnect delay variations caused by the noise is derived. For typical 130-nm interconnects, the model is shown to be very accurate.
AB - For long interconnects, the power-supply noise injected through the repeaters can be more critical than crosstalk simply because there is no easy way to get rid of it. This paper rigorously analyzes the injection mechanism using a novel device model. A closed-form expression quantifying the interconnect delay variations caused by the noise is derived. For typical 130-nm interconnects, the model is shown to be very accurate.
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M3 - Conference contribution
AN - SCOPUS:8644265219
SN - 0780383087
T3 - Proceedings of the IEEE 2004 International Interconnect Technology Conference
SP - 113
EP - 115
BT - Proceedings of the IEEE 2004 International Interconnect Technology Conference
T2 - Proceedings of the IEEE 2004 International Interconnect Technology Conference
Y2 - 7 June 2004 through 9 June 2004
ER -