A molecular dynamics study of a 5 keV C60 fullerene impact on a two-component organic molecular sample

M. G. Ponomarev, B. J. Garrison, J. C. Vickerman, R. P. Webb

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

A study has been made to explore impact-induced desorption of C 60 fullerenes embedded in a benzene matrix as a model of matrix assisted secondary ion mass spectrometry. A fullerene concentration of about 0.5% was incorporated in a coarse-grained benzene target and then struck by a 5 keV fullerene projectile. The response of the benzene target was compared with a pure benzene target to observe the effects of the embedded molecules on the matrix. Three different trajectories were investigated. In the first, a single sputtered fullerene was ejected joined to a carbon atom from the projectile. In the second, an undamaged C60 was ejected, and in the third, no intact fullerenes were ejected. In all three cases, 4-6 fullerenes were pushed above the initial surface but were relocated into the crater rim, enriching the surface layer with the heavier and more strongly bound component. It is observed that the sputtered fullerenes are ejected with a number of matrix molecules, and that there is a small decrease in the internal energy of the ejected fullerene that corresponds to the gradual separation of the surrounding matrix molecules from the larger molecule. This evaporative cooling may provide a potential benefit to Matrix Assisted SIMS.

Original languageEnglish (US)
Pages (from-to)107-111
Number of pages5
JournalSurface and Interface Analysis
Volume43
Issue number1-2
DOIs
StatePublished - Jan 2011

All Science Journal Classification (ASJC) codes

  • General Chemistry
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

Fingerprint

Dive into the research topics of 'A molecular dynamics study of a 5 keV C60 fullerene impact on a two-component organic molecular sample'. Together they form a unique fingerprint.

Cite this