A Morphable Physically Unclonable Function and True Random Number Generator using a Commercial Magnetic Memory

Mohammad Nasim Imtiaz Khan, Chak Yuen Cheng, Sung Hao Lin, Abdullah Ash-Saki, Swaroop Ghosh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations

Abstract

In this work, a morphable security primitive using commercial magnetic memory is proposed which can be utilized as a Physically Unclonable Function (PUF) and as a True Random Number Generator (TRNG) by manipulating the write time and the number of write pulses respectively. The intra-HD, inter-HD, energy, bandwidth and area of the proposed PUF is found to be 0, 46.25%, 0.14pJ/bit, 0.34Gbit/s and \mathbf{0.385}\mu\mathbf{m}^{\mathbf{2}}/\mathbf{bit} (including peripherals) respectively. The proposed TRNG provides all possible outcomes with a standard deviation of 0.0062, correlation coefficient of 0.05 and an entropy of 0.95. The energy, bandwidth and area of the proposed TRNG is found to be 0.41pJ/bit, 0.12Gbit/s and \mathbf{0.769}\mu\mathbf{m}^{\mathbf{2}}/\mathbf{bit} (including peripherals). The proposed TRNG has also been tested with NIST test suite.

Original languageEnglish (US)
Title of host publicationProceedings of the 21st International Symposium on Quality Electronic Design, ISQED 2020
PublisherIEEE Computer Society
Pages197
Number of pages1
ISBN (Electronic)9781728142074
DOIs
StatePublished - Mar 2020
Event21st International Symposium on Quality Electronic Design, ISQED 2020 - Santa Clara, United States
Duration: Mar 25 2020Mar 26 2020

Publication series

NameProceedings - International Symposium on Quality Electronic Design, ISQED
Volume2020-March
ISSN (Print)1948-3287
ISSN (Electronic)1948-3295

Conference

Conference21st International Symposium on Quality Electronic Design, ISQED 2020
Country/TerritoryUnited States
CitySanta Clara
Period3/25/203/26/20

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

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