Abstract
This paper proposes a new self-healing methodology for embedded RF amplifiers in RF sub-systems. The proposed methodology is based on oscillation principles in which the device-under-test (DUT) generates its test signature with the help of additional circuitry. In the proposed methodology, the self-generated test signature from the RF amplifier is analyzed by using on-chip resources for testing and controlling its calibration knobs to compensate for multi-parameter variations in the manufacturing process. Thus, the proposed methodology enables self-test and self-calibration/correction of RF amplifiers without the need for an external test stimulus, enabling true self-healing RF designs. The proposed methodology is demonstrated through simulations as well as measurements performed on an RF LNA, which were designed in a commercially-available SiGe BiCMOS process technology.
Original language | English (US) |
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Article number | 6104211 |
Pages (from-to) | 1835-1848 |
Number of pages | 14 |
Journal | IEEE Transactions on Very Large Scale Integration (VLSI) Systems |
Volume | 20 |
Issue number | 10 |
DOIs | |
State | Published - 2012 |
All Science Journal Classification (ASJC) codes
- Software
- Hardware and Architecture
- Electrical and Electronic Engineering