A new self-healing methodology for RF amplifier circuits based on oscillation principles

Abhilash Goyal, Madhavan Swaminathan, Abhijit Chatterjee, Duane C. Howard, John D. Cressler

Research output: Contribution to journalArticlepeer-review

35 Scopus citations


This paper proposes a new self-healing methodology for embedded RF amplifiers in RF sub-systems. The proposed methodology is based on oscillation principles in which the device-under-test (DUT) generates its test signature with the help of additional circuitry. In the proposed methodology, the self-generated test signature from the RF amplifier is analyzed by using on-chip resources for testing and controlling its calibration knobs to compensate for multi-parameter variations in the manufacturing process. Thus, the proposed methodology enables self-test and self-calibration/correction of RF amplifiers without the need for an external test stimulus, enabling true self-healing RF designs. The proposed methodology is demonstrated through simulations as well as measurements performed on an RF LNA, which were designed in a commercially-available SiGe BiCMOS process technology.

Original languageEnglish (US)
Article number6104211
Pages (from-to)1835-1848
Number of pages14
JournalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
Issue number10
StatePublished - 2012

All Science Journal Classification (ASJC) codes

  • Software
  • Hardware and Architecture
  • Electrical and Electronic Engineering


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