TY - JOUR
T1 - A new statistical approach to automated quality control in manufacturing processes
AU - Milo, Michael W.
AU - Roan, Michael
AU - Harris, Bradley
N1 - Publisher Copyright:
© 2015 The Society of Manufacturing Engineers. Published by Elsevier Ltd. All rights reserved.
PY - 2015
Y1 - 2015
N2 - Automated quality control is a key aspect of industrial maintenance. In manufacturing processes, this is often done by monitoring relevant system parameters to detect deviations from normal behavior. Previous approaches define "normalcy" as statistical distributions for a given system parameter, and detect deviations from normal by hypothesis testing. This paper develops an approach to manufacturing quality control using a newly introduced method: Bayesian Posteriors Updated Sequentially and Hierarchically (BPUSH). This approach outperforms previous methods, achieving reliable detection of faulty parts with low computational cost and low false alarm rates (∼0.1%). Finally, this paper shows that sample size requirements for BPUSH fall well below typical sizes for comparable quality control methods, achieving True Positive Rates (TPR) >99% using as few as n = 25 samples.
AB - Automated quality control is a key aspect of industrial maintenance. In manufacturing processes, this is often done by monitoring relevant system parameters to detect deviations from normal behavior. Previous approaches define "normalcy" as statistical distributions for a given system parameter, and detect deviations from normal by hypothesis testing. This paper develops an approach to manufacturing quality control using a newly introduced method: Bayesian Posteriors Updated Sequentially and Hierarchically (BPUSH). This approach outperforms previous methods, achieving reliable detection of faulty parts with low computational cost and low false alarm rates (∼0.1%). Finally, this paper shows that sample size requirements for BPUSH fall well below typical sizes for comparable quality control methods, achieving True Positive Rates (TPR) >99% using as few as n = 25 samples.
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U2 - 10.1016/j.jmsy.2015.06.001
DO - 10.1016/j.jmsy.2015.06.001
M3 - Article
AN - SCOPUS:84937203669
SN - 0278-6125
VL - 36
SP - 159
EP - 167
JO - Journal of Manufacturing Systems
JF - Journal of Manufacturing Systems
ER -