@inproceedings{8a4688be2e8a47639bc3759c8e85d77d,
title = "A novel approach to modeling single event upsets in digital microelectronic devices",
abstract = "A new Monte Carlo toolkit Single Event Upset Simulator (SEUS) is under development. The code models the particle interactions on a constrained reaction space with detailed geometrical representation. Nucleon-nucleus interactions relevant to single event upsets are compiled from the simulation results of various intranuclear codes as well as from various cross section libraries such as ENDF/B-xx with a predefined energy group structure. The reaction products are then sampled from the precompiled library of an ensemble of all possible reaction exit channels. In this work, the development of the first module of the toolkit will be presented. The toolkit is implemented in C++ to ease integration with GEANT4.",
author = "Cetiner, {S. M.} and C. Celik and K. {\"U}n{\"l}u and V. Narayanan and Irwin, {M. J.} and Y. Xie",
year = "2008",
language = "English (US)",
isbn = "9781605607870",
series = "International Conference on Advances in Nuclear Power Plants, ICAPP 2008",
pages = "853--860",
booktitle = "American Nuclear Society - International Conference on Advances in Nuclear Power Plants, ICAPP 2008",
note = "International Conference on Advances in Nuclear Power Plants, ICAPP 2008 ; Conference date: 08-06-2008 Through 12-06-2008",
}