A novel delay fault testing methodology using low-overhead built-in delay sensor

Keyphrases

• Automatic Test Equipment 33%
• Delay Fault Testing 100%
• Delay Faults 100%
• Delay Sensor 100%
• External Testing 33%
• Fault Coverage 66%
• Internal Nodes 33%
• On-die 33%
• Test Point Insertion 33%
• Transition Faults 33%

Engineering

• Area Overhead 50%
• Built-in Self Test 100%
• Critical Path 100%
• Experimental Result 50%
• Fault Model 100%
• Test Equipment 50%
• Test Point 50%

Computer Science

• build-in self-test 100%
• Critical Path 50%
• Experimental Result 50%
• Fault Coverage 100%