Keyphrases
Fault-tolerant
100%
Low Overhead
100%
Adaptive Clocking
100%
Throughput Degradation
66%
Fault-free
33%
Transistor
16%
Area Overhead
16%
Performance Overhead
16%
Corrective
16%
Manufacturing Process
16%
Mutually Exclusive
16%
SimpleScalar
16%
Fault Type
16%
Corrupt
16%
Operand
16%
Redundancy
16%
Yield Loss
16%
Low Priority
16%
Superscalar Processor
16%
One-bit
16%
Failure Cause
16%
Fault Model
16%
Stuck-at
16%
Superscalar pipeline
16%
Fault-tolerant Strategy
16%
Design for Manufacturing
16%
Scan Flip-flop
16%
64-bit
16%
Computer Science
Fault Tolerant
100%
Clock Cycle
50%
Superscalar Processor
50%
Output Register
50%
Superscalar
50%
Engineering
Adders
100%
Defects
36%
Area Overhead
9%
Manufacturing Process
9%
Feature Size
9%
Bridging
9%
Flip Flop Circuits
9%
Fault Model
9%
Design for Manufacture
9%
Clock Cycle
9%