A novel method for testing integrated RF substrates

Abhilash Goyal, Madhavan Swaminathan, Chirs Ward, George White, Abhijit Chatterjee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Scopus citations


This paper discusses a novel and a low cost testing technique for integrated radio frequency (RF) substrates with embedded passive filters. This technique is based on resonator and regression analyses and uses low-frequency measurements to predict the filter's insertion loss at high frequency. Moreover, only one-port (S11) measurement is required for this two-port parameter prediction. Hence; this novel testing technique reduces the cost of test equipments and testing time. To show the feasibility of this proposed methodology both simulation and hardware results are presented for embedded diplexer. The results show that by our proposed methodology, testing frequency can be reduced by approximately 47% for low-pass filter and 33% for high-pass filter of the design frequency.

Original languageEnglish (US)
Title of host publication2007 Asia-Pacific Microwave Conference, APMC
StatePublished - 2007
EventAsia-Pacific Microwave Conference, APMC 2007 - Bangkok, Thailand
Duration: Dec 11 2007Dec 14 2007

Publication series

NameAsia-Pacific Microwave Conference Proceedings, APMC


ConferenceAsia-Pacific Microwave Conference, APMC 2007

All Science Journal Classification (ASJC) codes

  • General Engineering


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