TY - GEN
T1 - A novel self-healing methodology for RF amplifier circuits based on oscillation principles
AU - Goyal, Abhilash
AU - Swaminathan, Madhavan
AU - Chatterjee, Abhijit
PY - 2009
Y1 - 2009
N2 - This paper proposes a novel self-healing methodology for embedded RF Amplifiers (LNAs) in RF sub-systems. The proposed methodology is based on oscillation principles in which the Device-under-Test (DUT) itself generates the output test signature with the help of additional circuitry. The selfgenerated test signature from the DUT is analyzed by using onchip resources for testing the LNA and controlling its calibration knobs to compensate for multi-parameter variations in the LNA manufacturing process. Thus, the proposed methodology enables self-test and self-calibration of RF circuits without the need for external test stimulus. The proposed methodology is demonstrated through simulations as well as measurements performed on a RF LNA.
AB - This paper proposes a novel self-healing methodology for embedded RF Amplifiers (LNAs) in RF sub-systems. The proposed methodology is based on oscillation principles in which the Device-under-Test (DUT) itself generates the output test signature with the help of additional circuitry. The selfgenerated test signature from the DUT is analyzed by using onchip resources for testing the LNA and controlling its calibration knobs to compensate for multi-parameter variations in the LNA manufacturing process. Thus, the proposed methodology enables self-test and self-calibration of RF circuits without the need for external test stimulus. The proposed methodology is demonstrated through simulations as well as measurements performed on a RF LNA.
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U2 - 10.1109/date.2009.5090929
DO - 10.1109/date.2009.5090929
M3 - Conference contribution
AN - SCOPUS:70350048807
SN - 9783981080155
T3 - Proceedings -Design, Automation and Test in Europe, DATE
SP - 1656
EP - 1661
BT - Proceedings - 2009 Design, Automation and Test in Europe Conference and Exhibition, DATE '09
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2009 Design, Automation and Test in Europe Conference and Exhibition, DATE '09
Y2 - 20 April 2009 through 24 April 2009
ER -