@inproceedings{4b8f792e3b5240ee98667d2f38fcffd2,
title = "A novel self-healing methodology for RF amplifier circuits based on oscillation principles",
abstract = "This paper proposes a novel self-healing methodology for embedded RF Amplifiers (LNAs) in RF sub-systems. The proposed methodology is based on oscillation principles in which the Device-under-Test (DUT) itself generates the output test signature with the help of additional circuitry. The selfgenerated test signature from the DUT is analyzed by using onchip resources for testing the LNA and controlling its calibration knobs to compensate for multi-parameter variations in the LNA manufacturing process. Thus, the proposed methodology enables self-test and self-calibration of RF circuits without the need for external test stimulus. The proposed methodology is demonstrated through simulations as well as measurements performed on a RF LNA.",
author = "Abhilash Goyal and Madhavan Swaminathan and Abhijit Chatterjee",
year = "2009",
doi = "10.1109/date.2009.5090929",
language = "English (US)",
isbn = "9783981080155",
series = "Proceedings -Design, Automation and Test in Europe, DATE",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1656--1661",
booktitle = "Proceedings - 2009 Design, Automation and Test in Europe Conference and Exhibition, DATE '09",
address = "United States",
note = "12th Design, Automation and Test in Europe Conference and Exhibition, DATE 2009 ; Conference date: 20-04-2009 Through 24-04-2009",
}