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A novel technique for Interfacial Thermal Resistance measurement for nanoscale thin films
R. A. Pulavarthy,
M. A. Haque
Mechanical Engineering
Materials Research Institute (MRI)
Research output
:
Contribution to journal
›
Article
›
peer-review
5
Scopus citations
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Engineering & Materials Science
Heat resistance
82%
Thin films
77%
Hafnium oxides
72%
Microelectronics
43%
Amplification
42%
Energy conversion
41%
Temperature control
39%
Infrared radiation
35%
Oxides
35%
Copper
33%
Temperature
32%
Silicon
32%
Aluminum
31%
Heat transfer
27%
Metals
26%
Chemical Compounds
Thermal Resistance
100%
Drop
70%
Thermometry
59%
Hafnium Atom
49%
Microelectronics
46%
Heat Transfer
44%
Oxide
22%
Physics & Astronomy
thermal resistance
89%
thin films
42%
hafnium oxides
37%
energy conversion
30%
microelectronics
27%
temperature measurement
24%
heat transfer
21%
copper
19%
aluminum
18%
oxides
17%
temperature
16%
silicon
14%
metals
14%