A self-testable SiGe LNA and built-in-self-test methodology for multiple performance specifications of RF amplifiers

Abhilash Goyal, Madhavan Swaminathan, Abhijit Chatterjee, Duane Howard, John D. Cressler

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

In this paper, a self-testable SiGe low noise amplifier (LNA) is designed and a Built-in-Self-Test (BIST) methodology is proposed for amplifiers embedded in RF systems. In this BIST methodology, the RF amplifier has the capability to simultaneously test multiple performance specifications on-chip, including Gain and PldB. The self-testable LNA can be placed in a testing mode, in which it self generates a signature of its health using oscillation principles. It eliminates the requirement of any external test stimulus for testing purposes, thus enables the possibility of self-testable RF designs. For the proof of concept, the presented SiGe LNA is designed to operate in the X-band (9.0 GHz) in a commercially-available 6 metal layer, 0.18 μm, 120 GHz SiGe BiCMOS platform. This self-testing design concept can be extended to CMOS amplifiers as well. Furthermore, in this paper, the built-in-self-test methodology is demonstrated using board-level as well as chip-level prototypes.

Original languageEnglish (US)
Title of host publicationProceedings of the 13th International Symposium on Quality Electronic Design, ISQED 2012
Pages7-12
Number of pages6
DOIs
StatePublished - 2012
Event13th International Symposium on Quality Electronic Design, ISQED 2012 - Santa Clara, CA, United States
Duration: Mar 19 2012Mar 21 2012

Publication series

NameProceedings - International Symposium on Quality Electronic Design, ISQED
ISSN (Print)1948-3287
ISSN (Electronic)1948-3295

Conference

Conference13th International Symposium on Quality Electronic Design, ISQED 2012
Country/TerritoryUnited States
CitySanta Clara, CA
Period3/19/123/21/12

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

Fingerprint

Dive into the research topics of 'A self-testable SiGe LNA and built-in-self-test methodology for multiple performance specifications of RF amplifiers'. Together they form a unique fingerprint.

Cite this