A Shuttle-Efficient Qubit Mapper for Trapped-Ion Quantum Computers

Suryansh Upadhyay, Abdullah Ash Saki, Rasit Onur Topaloglu, Swaroop Ghosh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations


Trapped-ion (TI) quantum computer is one of the forerunner quantum technologies. Execution of a quantum gate in multiple trap TI system may frequently involve ions from two different traps, hence one of the ions needs to be shuttled (moved) between traps to be co-located, degrading fidelity, and increasing the program execution time. The choice of initial mapping influences the number of shuttles. The existing Greedy policy neglects the depth of the program at which a gate is present. Intuitively, the contribution of the late-stage gates to the initial mapping is less since the ions might have already shuttled to a different trap to satisfy other gate operations. In this paper, we target this gap and propose a new program adaptive policy especially for programs with considerable depth and high number of qubits (valid for practical-scale quantum programs). Our technique achieves an average reduction of 9% shuttles/program (with 21.3% at best) for 120 random circuits and enhances the program fidelity up to 3.3X (1.41X on average).

Original languageEnglish (US)
Title of host publicationGLSVLSI 2022 - Proceedings of the Great Lakes Symposium on VLSI 2022
PublisherAssociation for Computing Machinery
Number of pages4
ISBN (Electronic)9781450393225
StatePublished - Jun 6 2022
Event32nd Great Lakes Symposium on VLSI, GLSVLSI 2022 - Irvine, United States
Duration: Jun 6 2022Jun 8 2022

Publication series

NameProceedings of the ACM Great Lakes Symposium on VLSI, GLSVLSI


Conference32nd Great Lakes Symposium on VLSI, GLSVLSI 2022
Country/TerritoryUnited States

All Science Journal Classification (ASJC) codes

  • General Engineering


Dive into the research topics of 'A Shuttle-Efficient Qubit Mapper for Trapped-Ion Quantum Computers'. Together they form a unique fingerprint.

Cite this