A simple reflectance method for estimation of the Al mole fraction of bulk AlGaN and AlGaN/GaN heterostructures

L. S. Yu; D. Qiao; S. S. Lau; J. M. Redwing

doi:10.1063/1.124712

A simple reflectance method for estimation of the Al mole fraction of bulk AlGaN and AlGaN/GaN heterostructures

L. S. Yu
, D. Qiao
, S. S. Lau
, J. M. Redwing

Research output: Contribution to journal › Article › peer-review

16 Scopus citations

Abstract

In this study, we report a simple optical reflectance method to characterize the Al mole fraction in bulk AlGaN and AlGaN/GaN heterostructures. This method is based on the concept of Fabry-Perot oscillations of a probing beam when the photon energy of the beam falls below the band-gap energy of the semiconductor. The accuracy and merits of this method in comparison with the more elaborate photoluminescence method are discussed.

Original language	English (US)
Pages (from-to)	1419-1421
Number of pages	3
Journal	Applied Physics Letters
Volume	75
Issue number	10
DOIs	https://doi.org/10.1063/1.124712
State	Published - Sep 6 1999

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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10.1063/1.124712

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abstract = "In this study, we report a simple optical reflectance method to characterize the Al mole fraction in bulk AlGaN and AlGaN/GaN heterostructures. This method is based on the concept of Fabry-Perot oscillations of a probing beam when the photon energy of the beam falls below the band-gap energy of the semiconductor. The accuracy and merits of this method in comparison with the more elaborate photoluminescence method are discussed.",

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T1 - A simple reflectance method for estimation of the Al mole fraction of bulk AlGaN and AlGaN/GaN heterostructures

AU - Yu, L. S.

AU - Qiao, D.

AU - Lau, S. S.

AU - Redwing, J. M.

PY - 1999/9/6

Y1 - 1999/9/6

N2 - In this study, we report a simple optical reflectance method to characterize the Al mole fraction in bulk AlGaN and AlGaN/GaN heterostructures. This method is based on the concept of Fabry-Perot oscillations of a probing beam when the photon energy of the beam falls below the band-gap energy of the semiconductor. The accuracy and merits of this method in comparison with the more elaborate photoluminescence method are discussed.

AB - In this study, we report a simple optical reflectance method to characterize the Al mole fraction in bulk AlGaN and AlGaN/GaN heterostructures. This method is based on the concept of Fabry-Perot oscillations of a probing beam when the photon energy of the beam falls below the band-gap energy of the semiconductor. The accuracy and merits of this method in comparison with the more elaborate photoluminescence method are discussed.

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UR - https://www.scopus.com/pages/publications/0032606656#tab=citedBy

U2 - 10.1063/1.124712

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M3 - Article

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SN - 0003-6951

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JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 10

ER -

A simple reflectance method for estimation of the Al mole fraction of bulk AlGaN and AlGaN/GaN heterostructures

Abstract

All Science Journal Classification (ASJC) codes

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