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A standardized approach to characterize hysteresis in 2D-materials-based transistors for stability benchmarking and performance projection

  • Alexander Karl
  • , Axel Verdianu
  • , Dominic Waldhoer
  • , Theresia Knobloch
  • , Joël Kurzweil
  • , Mina Bahrami
  • , Mohammad Rasool Davoudi
  • , Pedram Khakbaz
  • , Bernhard Stampfer
  • , Seyed Mehdi Sattari-Esfahlan
  • , Yury Illarionov
  • , Aftab Nazir
  • , Changze Liu
  • , Yu Zheng
  • , Lorenzo Pettorosso
  • , Dmitry Polyushkin
  • , Thomas Müller
  • , Saptarshi Das
  • , Xiao Renshaw Wang
  • , Junchuan Tang
    • Yichi Zhang, Congwei Tan, Ye Li, Hailin Peng, Michael Waltl, Tibor Grasser

Research output: Contribution to journal › Article › peer-review

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