Abstract
We report the successful growth of high-quality GaAs1-xSbx nanowires on monolayer graphene/SiO2/p-Si (111) using molecular beam epitaxy (MBE) for the application of a flexible near-infrared photodetector. A systematic and detailed study of NW growth parameters, namely, growth temperature, V/III beam equivalent pressure (BEP) ratio, and Ga shutter opening duration, has been carried out. Growth of vertical â111»oriented nanowires on graphene with 4 K photoluminescence emission in the range 1.24-1.38 eV has been achieved. The presence of a weak D mode in Raman spectra of NWs grown on graphene suggests that NW growth did not alter the intrinsic properties of the monolayer graphene. High-resolution transmission electron microscopy and a selective area diffraction pattern confirmed the zinc-blende crystal structure of the NWs. This study suggests that Sb as a surfactant plays a critical role in the surface engineering of the substrate, leading to the superior optical quality of NWs exhibiting a higher 4 K photoluminescence intensity and lower full width at half maxima (fwhm) with significant improvement in optical responsivity compared to NWs grown on Si substrate of similar Sb composition.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 4528-4537 |
| Number of pages | 10 |
| Journal | ACS Applied Nano Materials |
| Volume | 2 |
| Issue number | 7 |
| DOIs | |
| State | Published - Jul 26 2019 |
All Science Journal Classification (ASJC) codes
- General Materials Science
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