A study of the microstructure of epitaxial heterostructures of YBa2Cu3O7 and PrBa2Cu3O7

C. L. Jia; B. Kabius; H. Soltner; U. Poppe; K. Urban; J. Schubert; Ch Buchal

doi:10.1016/0921-4534(90)90661-W

A study of the microstructure of epitaxial heterostructures of YBa₂Cu₃O₇ and PrBa₂Cu₃O₇

C. L. Jia
, B. Kabius
, H. Soltner
, U. Poppe
, K. Urban
, J. Schubert
, Ch Buchal

Materials Research Institute (MRI)

Research output: Contribution to journal › Article › peer-review

27 Scopus citations

Abstract

Multilayers with a sequence of YBa₂Cu₃O₇/PrBa₂Cu₃O₇/YBa₂Cu₃O₇ have been sputtered epitaxially on [001] SrTiO₃ substrates. The heterostructures of these samples have been characterized by high-resolution electron microscopy, Rutherford backscattering and energy-dispersive X-ray analysis. The results indicate a correlation between the substrate quality and the microstructure of the thin films. Substrates with low defect density, a very smooth surface, and good orientation favour the epitaxial growth of all three layers. The chemical composition across the interface changes within the dimension of one unit cell.

Original language	English (US)
Pages (from-to)	463-471
Number of pages	9
Journal	Physica C: Superconductivity and its Applications
Volume	167
Issue number	5-6
DOIs	https://doi.org/10.1016/0921-4534(90)90661-W
State	Published - May 15 1990

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Energy Engineering and Power Technology
Electrical and Electronic Engineering

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10.1016/0921-4534(90)90661-W

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title = "A study of the microstructure of epitaxial heterostructures of YBa2Cu3O7 and PrBa2Cu3O7",

abstract = "Multilayers with a sequence of YBa2Cu3O7/PrBa2Cu3O7/YBa2Cu3O7 have been sputtered epitaxially on [001] SrTiO3 substrates. The heterostructures of these samples have been characterized by high-resolution electron microscopy, Rutherford backscattering and energy-dispersive X-ray analysis. The results indicate a correlation between the substrate quality and the microstructure of the thin films. Substrates with low defect density, a very smooth surface, and good orientation favour the epitaxial growth of all three layers. The chemical composition across the interface changes within the dimension of one unit cell.",

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T1 - A study of the microstructure of epitaxial heterostructures of YBa2Cu3O7 and PrBa2Cu3O7

AU - Jia, C. L.

AU - Kabius, B.

AU - Soltner, H.

AU - Poppe, U.

AU - Urban, K.

AU - Schubert, J.

AU - Buchal, Ch

PY - 1990/5/15

Y1 - 1990/5/15

N2 - Multilayers with a sequence of YBa2Cu3O7/PrBa2Cu3O7/YBa2Cu3O7 have been sputtered epitaxially on [001] SrTiO3 substrates. The heterostructures of these samples have been characterized by high-resolution electron microscopy, Rutherford backscattering and energy-dispersive X-ray analysis. The results indicate a correlation between the substrate quality and the microstructure of the thin films. Substrates with low defect density, a very smooth surface, and good orientation favour the epitaxial growth of all three layers. The chemical composition across the interface changes within the dimension of one unit cell.

AB - Multilayers with a sequence of YBa2Cu3O7/PrBa2Cu3O7/YBa2Cu3O7 have been sputtered epitaxially on [001] SrTiO3 substrates. The heterostructures of these samples have been characterized by high-resolution electron microscopy, Rutherford backscattering and energy-dispersive X-ray analysis. The results indicate a correlation between the substrate quality and the microstructure of the thin films. Substrates with low defect density, a very smooth surface, and good orientation favour the epitaxial growth of all three layers. The chemical composition across the interface changes within the dimension of one unit cell.

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IS - 5-6

ER -

A study of the microstructure of epitaxial heterostructures of YBa₂Cu₃O₇ and PrBa₂Cu₃O₇

Abstract

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