TY - JOUR
T1 - A Survey of Test Techniques for MCM Substrates
AU - Swaminathan, Madhavan
AU - Kim, Bruce
AU - Chatterjee, Abhijit
PY - 1997
Y1 - 1997
N2 - This paper provides a survey of MCM substrate test techniques. Test techniques that are based on capacitance, resistance, electron beam, latent opens, time domain network analysis (TDNA) and RF resonator are discussed. In this paper, test techniques are applied to interconnect testing.
AB - This paper provides a survey of MCM substrate test techniques. Test techniques that are based on capacitance, resistance, electron beam, latent opens, time domain network analysis (TDNA) and RF resonator are discussed. In this paper, test techniques are applied to interconnect testing.
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U2 - 10.1023/a:1008214330042
DO - 10.1023/a:1008214330042
M3 - Review article
AN - SCOPUS:0031069792
SN - 0923-8174
VL - 10
SP - 27
EP - 38
JO - Journal of Electronic Testing: Theory and Applications (JETTA)
JF - Journal of Electronic Testing: Theory and Applications (JETTA)
IS - 1-2
ER -