A time-of-flight SIMS study of the chemical nature of highly dispersed Pt on alumina

Y. Zhou; M. C. Wood; N. Winograd

doi:10.1016/0021-9517(94)90010-8

A time-of-flight SIMS study of the chemical nature of highly dispersed Pt on alumina

Y. Zhou, M. C. Wood, N. Winograd

Research output: Contribution to journal › Article › peer-review

32 Scopus citations

Abstract

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been employed to examine the chemistry of highly dispersed Pt on alumina. In particular, we have characterized various negatively charged Pt cluster ions emitted from Pt powder and fresh and discharged 0.6% Pt Al₂O₃ after bombardment with 25-keV Ga⁺ ions. For Pt powder, PtO^- and PtO₂^- dominate the spectrum of negative ions, which indicates the presence of surface Pt oxides. The most important observation, however, is that PtCl^-, PtClO^-, and PtCl₂^- cluster ions dominate the negative ion spectrum of 0.6% Pt Al₂O₃. These chlorinated Pt ions provide direct spectroscopic evidence that some Cl atoms are still bound to Pt after high-temperature oxidation and reduction.

Original language	English (US)
Pages (from-to)	82-86
Number of pages	5
Journal	Journal of Catalysis
Volume	146
Issue number	1
DOIs	https://doi.org/10.1016/0021-9517(94)90010-8
State	Published - Mar 1994

All Science Journal Classification (ASJC) codes

Catalysis
Physical and Theoretical Chemistry

Access to Document

10.1016/0021-9517(94)90010-8

Cite this

@article{97bf3ee7e35641b2813897565dac6575,

title = "A time-of-flight SIMS study of the chemical nature of highly dispersed Pt on alumina",

abstract = "Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been employed to examine the chemistry of highly dispersed Pt on alumina. In particular, we have characterized various negatively charged Pt cluster ions emitted from Pt powder and fresh and discharged 0.6% Pt Al2O3 after bombardment with 25-keV Ga+ ions. For Pt powder, PtO- and PtO2- dominate the spectrum of negative ions, which indicates the presence of surface Pt oxides. The most important observation, however, is that PtCl-, PtClO-, and PtCl2- cluster ions dominate the negative ion spectrum of 0.6% Pt Al2O3. These chlorinated Pt ions provide direct spectroscopic evidence that some Cl atoms are still bound to Pt after high-temperature oxidation and reduction.",

author = "Y. Zhou and Wood, {M. C.} and N. Winograd",

note = "Funding Information: The authors thank the National Science Foundation, the Office of Naval Research, and the Department of Energy for partial financial support. We also appreciate the suggestions and encouragement of Cindy Kovalski.",

year = "1994",

month = mar,

doi = "10.1016/0021-9517(94)90010-8",

language = "English (US)",

volume = "146",

pages = "82--86",

journal = "Journal of Catalysis",

issn = "0021-9517",

publisher = "Academic Press Inc.",

number = "1",

}

TY - JOUR

T1 - A time-of-flight SIMS study of the chemical nature of highly dispersed Pt on alumina

AU - Zhou, Y.

AU - Wood, M. C.

AU - Winograd, N.

N1 - Funding Information: The authors thank the National Science Foundation, the Office of Naval Research, and the Department of Energy for partial financial support. We also appreciate the suggestions and encouragement of Cindy Kovalski.

PY - 1994/3

Y1 - 1994/3

N2 - Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been employed to examine the chemistry of highly dispersed Pt on alumina. In particular, we have characterized various negatively charged Pt cluster ions emitted from Pt powder and fresh and discharged 0.6% Pt Al2O3 after bombardment with 25-keV Ga+ ions. For Pt powder, PtO- and PtO2- dominate the spectrum of negative ions, which indicates the presence of surface Pt oxides. The most important observation, however, is that PtCl-, PtClO-, and PtCl2- cluster ions dominate the negative ion spectrum of 0.6% Pt Al2O3. These chlorinated Pt ions provide direct spectroscopic evidence that some Cl atoms are still bound to Pt after high-temperature oxidation and reduction.

AB - Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been employed to examine the chemistry of highly dispersed Pt on alumina. In particular, we have characterized various negatively charged Pt cluster ions emitted from Pt powder and fresh and discharged 0.6% Pt Al2O3 after bombardment with 25-keV Ga+ ions. For Pt powder, PtO- and PtO2- dominate the spectrum of negative ions, which indicates the presence of surface Pt oxides. The most important observation, however, is that PtCl-, PtClO-, and PtCl2- cluster ions dominate the negative ion spectrum of 0.6% Pt Al2O3. These chlorinated Pt ions provide direct spectroscopic evidence that some Cl atoms are still bound to Pt after high-temperature oxidation and reduction.

UR - http://www.scopus.com/inward/record.url?scp=0001882542&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0001882542&partnerID=8YFLogxK

U2 - 10.1016/0021-9517(94)90010-8

DO - 10.1016/0021-9517(94)90010-8

M3 - Article

AN - SCOPUS:0001882542

SN - 0021-9517

VL - 146

SP - 82

EP - 86

JO - Journal of Catalysis

JF - Journal of Catalysis

IS - 1

ER -

A time-of-flight SIMS study of the chemical nature of highly dispersed Pt on alumina

Abstract

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this