Aberration correction for analytical in situ TEM - The NTEAM concept

B. Kabius; C. W. Allen; D. J. Miller

doi:10.1017/s1431927602100535

Aberration correction for analytical in situ TEM - The NTEAM concept

B. Kabius
, C. W. Allen
, D. J. Miller

Materials Research Institute (MRI)

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Original language	English (US)
Pages (from-to)	418-419
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	8
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/s1431927602100535
State	Published - 2002

All Science Journal Classification (ASJC) codes

Instrumentation

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title = "Aberration correction for analytical in situ TEM - The NTEAM concept",

author = "B. Kabius and Allen, \{C. W.\} and Miller, \{D. J.\}",

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AU - Kabius, B.

AU - Allen, C. W.

AU - Miller, D. J.

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JO - Microscopy and Microanalysis

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IS - SUPPL. 2

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Aberration correction for analytical in situ TEM - The NTEAM concept

All Science Journal Classification (ASJC) codes

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