Absence of low-temperature phase transitions in epitaxial BaTiO3 thin films

  • D. A. Tenne
  • , X. X. Xi
  • , Y. L. Li
  • , L. Q. Chen
  • , A. Soukiassian
  • , M. H. Zhu
  • , A. R. James
  • , J. Lettieri
  • , D. G. Schlom
  • , W. Tian
  • , X. Q. Pan

Research output: Contribution to journalArticlepeer-review

84 Scopus citations

Abstract

We have studied phase transitions in epitaxial BaTiO3 thin films by Raman spectroscopy. The films are found to remain in a single ferroelectric phase over the temperature range from 5 to 325 K. The low-temperature phase transitions characteristic of bulk BaTiO3 (tetragonal-orthorhombic- rhombohedral) are absent in the films. X-ray diffraction shows that the BaTiO3 films are under tensile strain due to the thermal expansion mismatch with the buffer layer. A phase-field calculation of the phase diagram and domain structures in BaTiO3 thin films predicts, without any priori assumption, that an orthorhombic phase with in-plane polarization is the thermodynamically stable phase for such values of tensile strain and temperature, consistent with the experimental Raman results.

Original languageEnglish (US)
Article number174101
Pages (from-to)174101-1-174101-5
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume69
Issue number17
DOIs
StatePublished - May 2004

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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