TY - GEN
T1 - Advanced packaging automation for opto-electronic systems
AU - Bhat, Shubham K.
AU - Kurzweg, Timothy
AU - Guez, Allon
PY - 2004/12/1
Y1 - 2004/12/1
N2 - In this paper, we present a learning control algorithm used in our research of advanced opto-electronic automation, which yields high performance, low cost opto-electronic alignment and packaging through the use of intelligent control theory and system-level modeling. The learning loop technique is activated at a lower sampling frequency for specific and appropriate tasks, to improve the knowledge based control model. Our automation technique is based on constructing an a priori knowledge based model, specific to the assembled package's optical power propagation characteristics. From this model, a piece-wise linear inverse model is created and used in the "feed-forward" loop. This model can be updated for increased accuracy through the learning loop.
AB - In this paper, we present a learning control algorithm used in our research of advanced opto-electronic automation, which yields high performance, low cost opto-electronic alignment and packaging through the use of intelligent control theory and system-level modeling. The learning loop technique is activated at a lower sampling frequency for specific and appropriate tasks, to improve the knowledge based control model. Our automation technique is based on constructing an a priori knowledge based model, specific to the assembled package's optical power propagation characteristics. From this model, a piece-wise linear inverse model is created and used in the "feed-forward" loop. This model can be updated for increased accuracy through the learning loop.
UR - http://www.scopus.com/inward/record.url?scp=23244447694&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=23244447694&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:23244447694
SN - 0780387228
T3 - 2004 1st IEEE Lightwave Technologies in Instrumentation and Measurement Conference
SP - 11
EP - 16
BT - 2004 1st IEEE Lightwave Technologies in Instrumentation and Measurement Conference
T2 - 2004 1st IEEE Lightwave Technologies in Instrumentation and Measurement Conference
Y2 - 19 October 2004 through 20 October 2004
ER -