Advances in High Performance RDL Technologies for Enabling IO Density of 500 IOs/mm/layer and 8-μm IO Pitch Using Low-k Dielectrics
- Fuhan Liu
- , Rui Zhang
- , Bartlet H. Deprospo
- , Shreya Dwarakanath
- , Pratik Nimbalkar
- , Siddharth Ravichandran
- , David Weyers
- , Mohanalingam Kathaperumal
- , Rao R. Tummala
- , Madhavan Swaminathan
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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