AlGaN/GaN HEMT with high PAE and breakdown voltage grown by ammonia MBE

Y. Pei, C. Suh, Rongming Chu, F. Recht, L. Shen, A. Corrion, C. Poblenz, J. Speck, U. K. Mishra

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publication65th DRC Device Research Conference
Number of pages2
StatePublished - Dec 1 2007
Event65th DRC Device Research Conference - South Bend, India
Duration: Jun 18 2007Jun 20 2007

Publication series

Name65th DRC Device Research Conference


Other65th DRC Device Research Conference
CitySouth Bend

All Science Journal Classification (ASJC) codes

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

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